Materials Characterization
Materials Characterization. Instructor: Dr. S. Sankaran, Department of Metallurgical and Materials Engineering, IIT Madras. This is the first course at the undergraduate level on microstructural characterization of materials. This course will cover the basic principles and techniques of X-ray diffraction, optical, scanning electron and transmission electron microscopy along with demonstrations of the instrument details and imaging experiments through videos. This course also deals with the sample preparation techniques for the microstructural analysis with practical examples through videos.
(from nptel.ac.in
Lecture 06 - Opaque Stop Microscopy, Phase Contrast Microscopy
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Optical Microscopy
Lecture 01 - Properties of Light, Image Formation
Lecture 02 - Magnification and Resolution
Lecture 03 - Depth of Field, Focus and Field of View
Lecture 04 - Lens Defects, Filters and Light Microscopy Introduction
Lecture 05 - Optical Microscope Demo, Bright Field Imaging, Opaque Specimen Illumination
Lecture 06 - Opaque Stop Microscopy, Phase Contrast Microscopy
Lecture 07 - Dark Field Microscopy, Polarization Microscopy
Lecture 08 - Differential Interference Contrast and Fluorescence Microscopy
Lecture 09 - Sample Preparation Techniques for Optical Microscopy
Lecture 10 - Tutorial Problems
Scanning Electron Microscopy
Lecture 11 - Introduction to Scanning Electron Microscopy
Lecture 12 - Lens Aberrations, Object Resolution, Image Quality
Lecture 13 - Interaction between Electrons and Sample, Imaging Capabilities, Structural Analysis, Elemental Analysis
Lecture 14 - SEM and its Mode of Operation, Effect of Aperture Size, Working Distance, Condenser Lens Strength
Lecture 15 - SEM and its Mode of Operation, Relation between Probe Current and Probe Diameter, Summary
Lecture 16 - Factors Affecting Interaction Volume, Demonstration of SEM
Lecture 17 - Image Formation and Interpretation
Lecture 18 - Image Formation and Interpretation (cont.), EDS, WDS
Lecture 19 - Special Contrast Mechanisms, Monte Carlo Simulations of Interaction Volume
Lecture 20 - Electron Channeling Contrast Imaging (ECCI), Electron Back Scattered Diffraction(EBSD)-Theory and Instrument Demonstration
Lecture 21 - Tutorial Problems on SEM
X-ray Diffraction
Lecture 22 - Basics of X-ray Emission from Source, Electron Excitation and X-ray Interaction with Materials in General
Lecture 23 - Properties of X-rays
Lecture 24 - Bragg's Law Derivation
Lecture 25 - Diffraction Relationship with Reciprocal Space
Lecture 26 - X-ray Scattering
Lecture 27 - Factors Affecting Intensities of X-ray Peaks
Lecture 28 - Factors Affecting Intensities of X-ray Peaks (cont.)
Lecture 29 - Effect of Crystallite Size and Strain on Intensity of X-rays
Lecture 30 - Profile Fit, Factors Affecting Peak Broadening
Lecture 31 - Indexing of Diffraction Pattern, Quantitative Analysis
Lecture 32 - Indexing, Quantitative Analysis, Residual Stress Measurements
Lecture 33 - XRD and Residual Stress Measurement - Lab Demonstration
Lecture 34 - Tutorial on X-ray Diffraction
Transmission Electron Microscopy
Lecture 35 - Introduction to Transmission Electron Microscopy (TEM)
Lecture 36 - Fundamentals of Transmission Electron Microscopy (TEM)
Lecture 37 - Basics of Diffraction
Lecture 38 - Basics of Diffraction (cont.)
Lecture 39 - TEM Imaging
Lecture 40 - TEM Imaging (cont.)
Lecture 41 - TEM Instrument Demonstration
Lecture 42 - TEM Sample Preparation
Lecture 43 - TEM Sample Preparation (cont.)
Lecture 44 - Tutorial problems on TEM
Tutorials on Quantitative Metallography
Lecture 45 - Quantitative Metallography: Tutorial 1
Lecture 46 - Quantitative Metallography: Tutorial 2
Lecture 47 - Quantitative Metallography: Tutorial 3
Lecture 48 - Quantitative Metallography: Tutorial 4
Lecture 49 - Quantitative Metallography: Tutorial 5
Lecture 50 - Quantitative Metallography: Tutorial 6
Lecture 51 - Quantitative Metallography: Tutorial 7