EE290F: Synchrotron Radiation for Materials Science Applications
EE290F: Synchrotron Radiation for Materials Science Applications (Spring 2007, UC Berkeley). Instructor: Professor David Attwood. This course covers topics: introduction to synchrotron radiation, X-ray optics, X-ray interaction with matter, wave propagation and refractive index, Brewster’s Angle, multilayer interface coatings, bending magnet radiation, coherent undulator radiation and its applications, X-ray diffraction for materials analysis, photoemission spectroscopy, zone plate microscopy and applications, and X-ray microtomography.
| Lecture 16 - X-Ray Absorption Spectroscopy: XAFS, NEXAFS, XANES, EXAFS |
|
Go to the Course Home or watch other lectures:
| Lecture 01 - Introduction to Synchrotron Radiation |
| Lecture 02 - X-ray Interaction with Matter: Absorption, Scattering, Refraction |
| Lecture 03 - Probing Matter: Diffraction, Spectroscopy and Photoemission |
| Lecture 04 - Radiation by an Accelerated Charge: Scattering by Free and Bound Electrons |
| Lecture 05 - Multi-Electron Atom, Atomic Scattering Factors: Wave Propagation and Refractive Index |
| Lecture 06 - Refraction and Reflection, Total Internal Reflection, Brewster's Angle, Kramers-Kronig |
| Lecture 07 - Multilayer Interference Coatings, Scattering, Diffraction, Reflectivity and Applications |
| Lecture 08 - Introduction to Synchrotron Radiation, Bending Magnet Radiation |
| Lecture 09 - Bending Magnet Critical Photon Energy, Undulator Central Radiation Cone |
| Lecture 10 - Undulator Equation and Radiated Power |
| Lecture 11 - Spectral Brightness of Undulator Radiation, Harmonics, Wiggler Radiation |
| Lecture 12 - Spatial and Temporal Coherence; Coherent Undulator Radiation |
| Lecture 13 - Applications of Coherent Undulator Radiation |
| Lecture 14 - Visit the Advanced Light Source, Berkeley (ALS) |
| Lecture 15 - Advanced Spectroscopy for Atomic and Molecular Physics |
| Lecture 16 - X-Ray Absorption Spectroscopy: XAFS, NEXAFS, XANES, EXAFS |
| Lecture 17 - X-Ray Diffraction for Materials Analysis |
| Lecture 18 - Photoemission and Photoemission Spectroscopy |
| Lecture 19 - Angle Resolved Photoemission and Non-ARPES |
| Lecture 20 - PhotoEmission Electron Microscopy (PEEM) |
| Lecture 21 - X-rays and Magnetism |
| Lecture 22 - XMCD; Out-of-Plane Bending Magnetic Radiation |
| Lecture 23 - Zone Plate Microscopy and Applications |
| Lecture 24 - Nanoscale Magnetic Imaging |
| Lecture 25 - Biological X-ray Microscopy |
| Lecture 26 - X-ray Microtomography |
| Lecture 27 - Coherent Soft X-ray Scattering for Studying Nanoscale Materials |
| Lecture 28 - Student Presentations |
| Lecture 29 - Student Presentations (cont.) |
| Lecture 30 - Student Presentations (cont.) |